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"Special issue on Best of Biometrics 2015."

Massimo Tistarelli et al. (2017)

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DOI: 10.1016/J.IMAVIS.2017.01.008

access: closed

type: Journal Article

metadata version: 2020-02-20

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  - https://dblp.org/rec/journals/ivc/TistarelliBFN17
Massimo Tistarelli, J. Ross Beveridge, Patrick J. Flynn, Michele Nappi:
Special issue on Best of Biometrics 2015. Image Vis. Comput. 58: 108-109 (2017)

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