"TSV Manufacturing Fault Modeling and Diagnosis Based on Multi-Tone Dither."

Yuling Shang et al. (2019)

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DOI: 10.20965/JACIII.2019.P0042

access: open

type: Journal Article

metadata version: 2021-02-16

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  - https://dblp.org/rec/journals/jaciii/ShangTLS19
Yuling Shang, Min Tan, Chunquan Li, Liyuan Sun:
TSV Manufacturing Fault Modeling and Diagnosis Based on Multi-Tone Dither. J. Adv. Comput. Intell. Intell. Informatics 23(1): 42-51 (2019)

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