"Formal Specification Based Automatic Test Generation for Embedded Network ..."

Eun-Hye Choi et al. (2014)

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DOI: 10.1155/2014/909762

access: open

type: Journal Article

metadata version: 2020-07-16

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Eun-Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, Hitoshi Ohsaki:
Formal Specification Based Automatic Test Generation for Embedded Network Systems. J. Appl. Math. 2014: 909762:1-909762:21 (2014)

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