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"Technical Note: An investigation of chaos in the RL-diode circuit using ..."

R. Kasap, E. Kurt (1998)

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DOI: 10.1155/S117391269800011X

access: open

type: Journal Article

metadata version: 2020-05-21

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R. Kasap, E. Kurt:
Technical Note: An investigation of chaos in the RL-diode circuit using the BDS test. Adv. Decis. Sci. 2(2): 193-199 (1998)

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