"Development of a cost analysis-based defect-prediction system with a type ..."

Jun Kim, Ju Yeon Lee (2022)

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DOI: 10.1093/JCDE/QWAC006

access: closed

type: Journal Article

metadata version: 2022-04-01

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Jun Kim, Ju Yeon Lee:
Development of a cost analysis-based defect-prediction system with a type error-weighted deep neural network algorithm. J. Comput. Des. Eng. 9(2): 380-392 (2022)

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