"Detecting faults in inner product masking scheme."

Wei Cheng et al. (2021)

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DOI: 10.1007/S13389-020-00227-6

access: closed

type: Journal Article

metadata version: 2023-08-28

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Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger, Sylvain Guilley:
Detecting faults in inner product masking scheme. J. Cryptogr. Eng. 11(2): 119-133 (2021)

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