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ORCID"Delay Testing Viability of Gate Oxide Short Defects."
Jean Marc Gallière et al. (2005)
- Jean Marc Gallière, Michel Renovell, Florence Azaïs, Yves Bertrand:
Delay Testing Viability of Gate Oxide Short Defects. J. Comput. Sci. Technol. 20(2): 195-200 (2005)
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