"Test-Data Generation Guided by Static Defect Detection."

Dan Hao et al. (2009)

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DOI: 10.1007/S11390-009-9224-5

access: closed

type: Journal Article

metadata version: 2022-10-02

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Dan Hao, Lu Zhang, Ming-Hao Liu, He Li, Jiasu Sun:
Test-Data Generation Guided by Static Defect Detection. J. Comput. Sci. Technol. 24(2): 284-293 (2009)

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