"A New Classification of Path-Delay Fault Testability in Terms of Stuck-at ..."

Subhashis Majumder et al. (2004)

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DOI: 10.1007/BF02973460

access: closed

type: Journal Article

metadata version: 2017-05-28

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Subhashis Majumder, Bhargab B. Bhattacharya, Vishwani D. Agrawal, Michael L. Bushnell:
A New Classification of Path-Delay Fault Testability in Terms of Stuck-at Faults. J. Comput. Sci. Technol. 19(6): 955-964 (2004)

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