"Coverage Optimization for Defect-Tolerance Logic Mapping on Nanoelectronic ..."

Bo Yuan, Bin Li (2012)

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DOI: 10.1007/S11390-012-1278-0

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type: Journal Article

metadata version: 2022-02-07

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Bo Yuan, Bin Li:
Coverage Optimization for Defect-Tolerance Logic Mapping on Nanoelectronic Crossbar Architectures. J. Comput. Sci. Technol. 27(5): 979-988 (2012)

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