"Comparative Study of Trace Metrics between Bibliometrics and Patentometrics."

Fred Y. Ye, Mu-Hsuan Huang, Dar-Zen Chen (2017)

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DOI: 10.20309/JDIS.201611

access: open

type: Journal Article

metadata version: 2022-05-13

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Fred Y. Ye, Mu-Hsuan Huang, Dar-Zen Chen:
Comparative Study of Trace Metrics between Bibliometrics and Patentometrics. J. Data Inf. Sci. 1(2): 13-31 (2017)

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