"Reliability engineering approach to digital watermark evaluation."

Hyung Cook Kim, Edward J. Delp (2006)

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DOI: 10.1117/1.2400608

access: closed

type: Journal Article

metadata version: 2017-06-06

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Hyung Cook Kim, Edward J. Delp:
Reliability engineering approach to digital watermark evaluation. J. Electronic Imaging 15(4): 041107 (2006)

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