"Sparse deep encoded features with enhanced sinogramic red deer ..."

Doaa A. Altantawy, Mohamed A. Yakout (2025)

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DOI: 10.1007/S10845-024-02377-4

access: closed

type: Journal Article

metadata version: 2025-07-04

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Doaa A. Altantawy, Mohamed A. Yakout:
Sparse deep encoded features with enhanced sinogramic red deer optimization for fault inspection in wafer maps. J. Intell. Manuf. 36(5): 3359-3397 (2025)

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