"eXplainable artificial intelligence for automatic defect detection in ..."

Harsh Bordekar et al. (2025)

> Home

Details and statistics

DOI: 10.1007/S10845-023-02272-4

access: closed

type: Journal Article

metadata version: 2025-03-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jim/BordekarCBPH25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jim/BordekarCBPH25
Harsh Bordekar, Nicola Cersullo, Marco Brysch, Jens Philipp, Christian Hühne:
eXplainable artificial intelligence for automatic defect detection in additively manufactured parts using CT scan analysis. J. Intell. Manuf. 36(2): 957-974 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.