"A case-based evolutionary model for defect classification of printed ..."

Pei-Chann Chang, Li-Yuan Chen, Chin-Yuan Fan (2008)

> Home

Details and statistics

DOI: 10.1007/S10845-008-0074-8

access: closed

type: Journal Article

metadata version: 2020-09-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jim/ChangCF08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jim/ChangCF08
Pei-Chann Chang, Li-Yuan Chen, Chin-Yuan Fan:
A case-based evolutionary model for defect classification of printed circuit board images. J. Intell. Manuf. 19(2): 203-214 (2008)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.