"Fast and efficient computing for deep learning-based defect detection ..."

Alparslan Fisne, Alperen Kalay, Süleyman Eken (2025)

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DOI: 10.1007/S10845-024-02487-Z

access: closed

type: Journal Article

metadata version: 2025-10-19

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Alparslan Fisne, Alperen Kalay, Süleyman Eken:
Fast and efficient computing for deep learning-based defect detection models in lightweight devices. J. Intell. Manuf. 36(7): 5035-5050 (2025)

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