"A chip inspection system based on a multiscale subarea attention network."

Yun Hou et al. (2025)

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DOI: 10.1007/S10845-024-02441-Z

access: closed

type: Journal Article

metadata version: 2025-07-31

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Yun Hou, Hong Fan, Ying Chen, Guangshuai Liu:
A chip inspection system based on a multiscale subarea attention network. J. Intell. Manuf. 36(6): 4039-4053 (2025)

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