"Wafer map defect pattern classification based on convolutional neural ..."

Cheng Hao Jin et al. (2020)

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DOI: 10.1007/S10845-020-01540-X

access: closed

type: Journal Article

metadata version: 2021-02-11

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Cheng Hao Jin, Hyun-Jin Kim, Yongjun Piao, Meijing Li, Minghao Piao:
Wafer map defect pattern classification based on convolutional neural network features and error-correcting output codes. J. Intell. Manuf. 31(8): 1861-1875 (2020)

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