"Applying the support vector machine with optimal parameter design into an ..."

Chung-Feng Jeffrey Kuo, Chun-Ping Tung, Wei-Han Weng (2019)

> Home

Details and statistics

DOI: 10.1007/S10845-016-1275-1

access: closed

type: Journal Article

metadata version: 2020-09-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jim/KuoTW19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jim/KuoTW19
Chung-Feng Jeffrey Kuo, Chun-Ping Tung, Wei-Han Weng:
Applying the support vector machine with optimal parameter design into an automatic inspection system for classifying micro-defects on surfaces of light-emitting diode chips. J. Intell. Manuf. 30(2): 727-741 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.