"Deep learning-based conductive particle inspection for TFT-LCDs inspired ..."

Chen Luo et al. (2025)

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DOI: 10.1007/S10845-023-02241-X

access: closed

type: Journal Article

metadata version: 2025-02-14

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Chen Luo, Tingxiao Fan, Yan Xia, Yijun Zhou, Lei Jia, Baocheng Hui:
Deep learning-based conductive particle inspection for TFT-LCDs inspired by parametric space envelope. J. Intell. Manuf. 36(1): 209-219 (2025)

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