"Towards a knowledge graph framework for ad hoc analysis in manufacturing."

Bart Meyers et al. (2024)

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DOI: 10.1007/S10845-023-02319-6

access: closed

type: Journal Article

metadata version: 2024-12-22

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  - https://dblp.org/rec/journals/jim/MeyersVLVNSMG24
Bart Meyers, Hans Vangheluwe, Pieter Lietaert, Geert Vanderhulst, Johan Van Noten, Michel Schaffers, Davy Maes, Klaas Gadeyne:
Towards a knowledge graph framework for ad hoc analysis in manufacturing. J. Intell. Manuf. 35(8): 3731-3752 (2024)

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