"Discriminative feature learning and cluster-based defect label ..."

Seyoung Park, Jaeyeon Jang, Chang Ouk Kim (2021)

> Home

Details and statistics

DOI: 10.1007/S10845-020-01571-4

access: closed

type: Journal Article

metadata version: 2021-10-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jim/ParkJK21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jim/ParkJK21
Seyoung Park, Jaeyeon Jang, Chang Ouk Kim:
Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels. J. Intell. Manuf. 32(1): 251-263 (2021)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.