"Analysis of Security Vulnerabilities for IoT Devices."

Hee-Hyun Kim, Jinho Yoo (2022)

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DOI: 10.3745/JIPS.03.0178

access: open

type: Journal Article

metadata version: 2022-10-12

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Hee-Hyun Kim, Jinho Yoo:
Analysis of Security Vulnerabilities for IoT Devices. J. Inf. Process. Syst. 18(4): 489-499 (2022)

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