"Incremental Model-based Test Suite Reduction with Formal Concept Analysis."

Pin Ng, Richard Y. K. Fung, Ray W. M. Kong (2010)

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DOI: 10.3745/JIPS.2010.6.2.197

access: open

type: Journal Article

metadata version: 2021-02-16

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Pin Ng, Richard Y. K. Fung, Ray W. M. Kong:
Incremental Model-based Test Suite Reduction with Formal Concept Analysis. J. Inf. Process. Syst. 6(2): 197-208 (2010)

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