"Robust Process Discovery with Artificial Negative Events."

Stijn Goedertier et al. (2009)

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DOI: 10.5555/1577069.1577113

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type: Journal Article

metadata version: 2022-06-02

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Stijn Goedertier, David Martens, Jan Vanthienen, Bart Baesens:
Robust Process Discovery with Artificial Negative Events. J. Mach. Learn. Res. 10: 1305-1340 (2009)

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