"Measuring knowledge exploration distance at the patent level: Application ..."

Jaewoong Choi, Janghyeok Yoon (2022)

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DOI: 10.1016/J.JOI.2022.101286

access: closed

type: Journal Article

metadata version: 2025-04-01

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Jaewoong Choi, Janghyeok Yoon:
Measuring knowledge exploration distance at the patent level: Application of network embedding and citation analysis. J. Informetrics 16(2): 101286 (2022)

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