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"Study and Reduction of Variability in 28 nm Fully Depleted Silicon on ..."
Zhaopeng Wei et al. (2016)
- Zhaopeng Wei, Gilles Jacquemod, Philippe Lorenzini, Frédéric Hameau, Emeric de Foucauld, Yves Leduc:
Study and Reduction of Variability in 28 nm Fully Depleted Silicon on Insulator Technology. J. Low Power Electron. 12(1): 64-73 (2016)
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