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"Efficient Test Set Modification for Capture Power Reduction."

Xiaoqing Wen et al. (2005)

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DOI: 10.1166/JOLPE.2005.042

access: closed

type: Journal Article

metadata version: 2020-05-22

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  - https://dblp.org/rec/journals/jolpe/WenSKMMWS05
Xiaoqing Wen, Tatsuya Suzuki, Seiji Kajihara, Kohei Miyase, Yoshihiro Minamoto, Laung-Terng Wang, Kewal K. Saluja:
Efficient Test Set Modification for Capture Power Reduction. J. Low Power Electron. 1(3): 319-330 (2005)

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