"Enhanced YOLOv5 for micro-defect detection on KDP crystal surfaces: a ..."

Kai Feng et al. (2025)

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DOI: 10.1007/S11554-025-01654-6

access: closed

type: Journal Article

metadata version: 2025-03-31

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Kai Feng, Shuhao He, Xinlong Wu, Peidong Jiang, Shuai Huang:
Enhanced YOLOv5 for micro-defect detection on KDP crystal surfaces: a fusion of EfficientNetV2 and normalized Wasserstein distance. J. Real Time Image Process. 22(2): 72 (2025)

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