"Using Hampel Identifier to Eliminate Profile-Isolated Outliers in Laser ..."

Zhibin Yao et al. (2019)

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DOI: 10.1155/2019/3823691

access: open

type: Journal Article

metadata version: 2025-01-19

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Zhibin Yao, Jiaquan Xie, Yaqin Tian, Qingxue Huang:
Using Hampel Identifier to Eliminate Profile-Isolated Outliers in Laser Vision Measurement. J. Sensors 2019: 3823691:1-3823691:12 (2019)

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