"Automatic test pattern generation can be solved as a constraint ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Károly Tilly, Lászlo Surján, Gyula Román (1993)

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DOI: 10.1016/0165-6074(93)90216-8

access: closed

type: Journal Article

metadata version: 2023-10-23

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Károly Tilly, Lászlo Surján, Gyula Román:
Automatic test pattern generation can be solved as a constraint satisfaction problem. Microprocess. Microprogramming 38(1-5): 715-722 (1993)

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