"A theoretical analysis on cloning the failed test cases to improve ..."

Long Zhang et al. (2017)

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DOI: 10.1016/J.JSS.2017.04.017

access: closed

type: Journal Article

metadata version: 2023-03-21

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Long Zhang, Lanfei Yan, Zhenyu Zhang, Jian Zhang, W. K. Chan, Zheng Zheng:
A theoretical analysis on cloning the failed test cases to improve spectrum-based fault localization. J. Syst. Softw. 129: 35-57 (2017)

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