"CMOS Impedance Analyzer for Nanosamples Investigation Operating up to 150 ..."

Davide Bianchi et al. (2014)

> Home

Details and statistics

DOI: 10.1109/JSSC.2014.2345025

access: closed

type: Journal Article

metadata version: 2020-08-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jssc/BianchiFRS14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jssc/BianchiFRS14
Davide Bianchi, Giorgio Ferrari, Angelo Rottigni, Marco Sampietro:
CMOS Impedance Analyzer for Nanosamples Investigation Operating up to 150 MHz With Sub-aF Resolution. IEEE J. Solid State Circuits 49(12): 2748-2757 (2014)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.