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"A 45 nm Resilient Microprocessor Core for Dynamic Variation Tolerance."
Keith A. Bowman et al. (2011)
- Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Paolo A. Aseron, Muhammad M. Khellah, Arijit Raychowdhury, Bibiche M. Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek K. De:
A 45 nm Resilient Microprocessor Core for Dynamic Variation Tolerance. IEEE J. Solid State Circuits 46(1): 194-208 (2011)
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