"Threshold voltage mismatch and intra-die leakage current in digital CMOS ..."

José Pineda de Gyvez, Hans Tuinhout (2004)

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DOI: 10.1109/JSSC.2003.820873

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type: Journal Article

metadata version: 2022-04-22

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José Pineda de Gyvez, Hans Tuinhout:
Threshold voltage mismatch and intra-die leakage current in digital CMOS circuits. IEEE J. Solid State Circuits 39(1): 157-168 (2004)

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