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"Sampling Circuits That Break the kT/C Thermal Noise Limit."

Ron Kapusta, Haiyang Zhu, Colin Lyden (2014)

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DOI: 10.1109/JSSC.2014.2320465

access: closed

type: Journal Article

metadata version: 2022-01-03

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Ron Kapusta, Haiyang Zhu, Colin Lyden:
Sampling Circuits That Break the kT/C Thermal Noise Limit. IEEE J. Solid State Circuits 49(8): 1694-1701 (2014)

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