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ORCID"Robust SRAM Design via BIST-Assisted Timing-Tracking (BATT)."
Ya-Chun Lai, Shi-Yu Huang (2009)
- Ya-Chun Lai, Shi-Yu Huang:
Robust SRAM Design via BIST-Assisted Timing-Tracking (BATT). IEEE J. Solid State Circuits 44(2): 642-649 (2009)
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