"A Highly Reliable RRAM Physically Unclonable Function Utilizing ..."

Bohan Lin et al. (2021)

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DOI: 10.1109/JSSC.2021.3050295

access: closed

type: Journal Article

metadata version: 2023-07-26

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Bohan Lin, Yachuan Pang, Bin Gao, Jianshi Tang, Dong Wu, Ting-Wei Chang, Wei-En Lin, Xiaoyu Sun, Shimeng Yu, Meng-Fan Chang, He Qian, Huaqiang Wu:
A Highly Reliable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source. IEEE J. Solid State Circuits 56(5): 1641-1650 (2021)

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