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"Spatial characterization of process variations via MOS transistor time ..."

Mohamed Nekili, Yvon Savaria, Guy Bois (1999)

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DOI: 10.1109/4.736658

access: closed

type: Journal Article

metadata version: 2022-07-05

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Mohamed Nekili, Yvon Savaria, Guy Bois:
Spatial characterization of process variations via MOS transistor time constants in VLSI and WSI. IEEE J. Solid State Circuits 34(1): 80-84 (1999)

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