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ORCID"Field Tolerant Dynamic Intrinsic Chip ID Using 32 nm High-K/Metal Gate SOI ..."
Sami Rosenblatt et al. (2013)
- Sami Rosenblatt, Daniel Fainstein, Alberto Cestero, John Safran, Norman Robson, Toshiaki Kirihata, Subramanian S. Iyer:
Field Tolerant Dynamic Intrinsic Chip ID Using 32 nm High-K/Metal Gate SOI Embedded DRAM. IEEE J. Solid State Circuits 48(4): 940-947 (2013)
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