"Realization of a three-valued logic built-in testing structure."

Côme Rozon, Hussein T. Mouftah (1990)

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DOI: 10.1109/4.102680

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type: Journal Article

metadata version: 2025-01-23

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Côme Rozon, Hussein T. Mouftah:
Realization of a three-valued logic built-in testing structure. IEEE J. Solid State Circuits 25(3): 814-820 (1990)

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