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"Physical random number generator based on MOS structure after soft breakdown."
Shinichi Yasuda et al. (2004)
- Shinichi Yasuda, Hideki Satake, Tetsufumi Tanamoto, Ryuji Ohba, Ken Uchida, Shinobu Fujita:
Physical random number generator based on MOS structure after soft breakdown. IEEE J. Solid State Circuits 39(8): 1375-1377 (2004)
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