Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Accelerated Defect Discovery and Reliability Improvement through ..."

Jeff Tian (2023)

> Home

Details and statistics

DOI: 10.17706/JSW.18.3.159-171

access: closed

type: Journal Article

metadata version: 2023-08-12

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/jsw/Tian23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jsw/Tian23
Jeff Tian:
Accelerated Defect Discovery and Reliability Improvement through Risk-Prioritized Testing for Web Applications. J. Softw. 18(3): 159-171 (2023)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.