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"Analyzing close relations between target artifacts for improving IR-based ..."

Haijuan Wang et al. (2021)

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DOI: 10.1631/FITEE.2000126

access: closed

type: Journal Article

metadata version: 2021-08-12

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  - journals/jzusc/WangSHYC21
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  - https://dblp.org/rec/journals/jzusc/WangSHYC21
Haijuan Wang, Guohua Shen, Zhiqiu Huang, Yaoshen Yu, Kai Chen:
Analyzing close relations between target artifacts for improving IR-based requirement traceability recovery. Frontiers Inf. Technol. Electron. Eng. 22(7): 957-968 (2021)

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