"The effect of the transient faults in dependability prediction."

Martin Danhel, Filip Stepánek, Hana Kubátová (2017)

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DOI: 10.1016/J.MICPRO.2017.05.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Martin Danhel, Filip Stepánek, Hana Kubátová:
The effect of the transient faults in dependability prediction. Microprocess. Microsystems 52: 498-504 (2017)

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