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"An improved multilayer perceptron approach for detecting sugarcane yield ..."

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DOI: 10.1016/J.MICPRO.2021.103822

access: closed

type: Withdrawn Item

metadata version: 2024-02-20

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(Withdrawn) An improved multilayer perceptron approach for detecting sugarcane yield production in IoT based smart agriculture. Microprocess. Microsystems 82: 103822 (2021)

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