"A robust wire crossing design for thermostability and fault tolerance in ..."

Yongqiang Zhang, Guangjun Xie, Jie Han (2020)

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DOI: 10.1016/J.MICPRO.2020.103033

access: closed

type: Journal Article

metadata version: 2021-09-23

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Yongqiang Zhang, Guangjun Xie, Jie Han:
A robust wire crossing design for thermostability and fault tolerance in quantum-dot cellular automata. Microprocess. Microsystems 74: 103033 (2020)

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