Stop the war!
Остановите войну!
for scientists:
default search action
"Reliability computer-aided design tool for full-chip electromigration ..."
Syed M. Alam et al. (2007)
- Syed M. Alam, Chee Lip Gan, Carl V. Thompson, Donald E. Troxel:
Reliability computer-aided design tool for full-chip electromigration analysis and comparison with different interconnect metallizations. Microelectron. J. 38(4-5): 463-473 (2007)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.