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"Compaction-based concurrent error detection for digital circuits."
Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris (2005)
- Sobeeh Almukhaizim, Petros Drineas, Yiorgos Makris:
Compaction-based concurrent error detection for digital circuits. Microelectron. J. 36(9): 856-862 (2005)
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