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"Reliability analysis and comparison of ring-PUF based on probabilistic models."

Jingchang Bian et al. (2024)

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DOI: 10.1016/J.MEJO.2023.106072

access: closed

type: Journal Article

metadata version: 2024-02-29

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Jingchang Bian, Zhengfeng Huang, Yankun Lin, Zhao Yang, Huaguo Liang, Tianming Ni:
Reliability analysis and comparison of ring-PUF based on probabilistic models. Microelectron. J. 144: 106072 (2024)

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